Bruker Dimension Icon Scanning Probe Microscope System
Year of Purchase: 2016
Manufacturer: Bruker (USA)
Technical Specifications:
Scanner Range: X-Y ≥ 90 µm; Z ≥ 9 µm
Scanner Noise: RMS < 0.3 Å
Lateral Resolution: 0.1 nm (X-Y direction)
Functions:
Measurement of material surface topography, roughness, and force curves.
Location: Gaojingjian Building, B1 Floor
Contact Person: Haili Huang
Telephone: 64441471
Email: hlhuang@mail.buct.edu.cn