Bruker Dimension Icon Scanning Probe Microscope System

Year of Purchase: 2016

Manufacturer: Bruker (USA)

Technical Specifications:

Scanner Range: X-Y ≥ 90 µm; Z ≥ 9 µm

Scanner Noise: RMS < 0.3 Å

Lateral Resolution: 0.1 nm (X-Y direction)

Functions:

Measurement of material surface topography, roughness, and force curves.

Location: Gaojingjian Building, B1 Floor

Contact Person: Haili Huang 

Telephone: 64441471

Email: hlhuang@mail.buct.edu.cn